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Teradyne (Genrad) Test Solutions

Ikon Test Solutions offers comprehensive Teradyne turnkey test solutions for both inline and offline testers. Our services include TSH51, TSH52, TestStation TS12x, and Teradyne GenRad GR228x. With extensive experience and specialized knowledge in test development and production support, we provide maximum test coverage on robust, production-friendly fixtures for your circuit boards. To ensure the highest levels of consistency, performance, throughput, and quality, all test programs are developed and enhanced by Ikon Test Solutions' own range of specialist software tools and custom test libraries.

To provide maximum and superior test coverage Ikon Test Solutions have developed their own automatically generated and unique "Hot Scan" method of testing digital clamp diodes. Our “Hot Scan” method not only compliments existing digital techniques but has the added benefit of helping to reduce costs through the removal of Opens Xpress / Framescan. Furthermore, our “Hot Scan” method has minimum impact on test cycle time.

Using our own in-house developed software enables us to generate and provide you with testability reports that gauge how effective our testing systems are.  Additionally, so that you have an expected test coverage for any planned solution a PCOLA (Component Coverage) - SOQ (Pin Coverage) formatted and detailed report is provided for your circuit board at the quotation stage.

We also provide unbiased, expert analysis of your existing ATE solutions and can advise you on relevant fixture / programme enhancements which are available.

Ikon Test Solutions Provide:

• (DFT) Design for Testability Reviews
• CAD Review and CAD Data Processing

• Test Programme Development - Simple to Complex:

Automated LED Colour and Intensity Detection
Vectorless - Opens Xpress, Framescan
Custom Device Test Model Development - Analog, Digital and Hybrid
Boundary Scan Testing
Cluster Testing
In System Programming - FLASH, EEPROM, CPLD, PIC etc., etc.
Functional Testing - Based on Customer Requirements and Test System Resources

• Test Programme Quality:

Fault Coverage, Stability, Reporting (Device / Pin Level)
Gauge Repeatability and Reproducibility. (On Request - Requires 10 Gold Sample Cards for Analysis)

• Test Programme and Fixture Documentation
• We also Provide Onsite Support and Training

For additional information contact Ikon Test Solutions.