Teradyne (GenRad)
We have extensive experience of test development and production support to draw upon. This allows us to provide maximum test coverage on a robust production friendly fixture for your boards. The test program will be developed and supplemented with Ikon Test Solutions software tools and custom test libraries to provide the highest consistency, performance, throughput, and quality.

We offer analysis of your existing test solutions with view of fixture/program enhancements. We can also provide onsite support when you have need for additional skilled engineering resource.

Design-For-Testability (DFT) reviews
CAD Review & CAD Data Processing
Test Program Development - Simple to Complex
Automated LED Color and Intensity Detection
Vectorless - Opens Xpress
Custom Device Test Model Development - Analog, Digital and Hybrid
Boundary Scan Testing
Cluster testing
In System Programming - FLASH, EEPROM, CPLD, PIC and many more.
Functional Testing – Based on customer requirement and test system resources.
Test Program Quality
Fault Coverage, Stability, Reporting (Device / Pin Level)
Gauge Repeatability and Reproducibility. (On Request. Requires 10 gold sample cards for analysis)
Test Program and Fixture Documentation
   
 
 
 
 
 
 
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